The systems are 200kV & 300kV Schottky thermal or Cold type Field Emission Transmission Electron Microscopes uniquely designed for performance across a wide range of applications, such as 2D and 3D imaging of proteins and macromolecular assemblies and cells, cell organelles and soft materials at liquid-nitrogen temperature.

# 300kV Cryo-TEM(Krios-G4) • Source: Field emission gun (X-FEG) • Accelerating voltage: 80-300kV • Spherical aberration: 2.7mm • Information limit: 0.12 nm (alpha tilt = 0°), 0.23 nm (alpha tilt = ± 70°) • Lenses: 3-condenser lens • Symmetric constant power objective lens • Loading: Automated and contamination-free cryo-autoloader (up to 12 Autogrids) • Stages: Computerized specimen stage with ± 70° alpha tilt • Pole piece gap: 11mm • Detector: Ceta-D, K3 BioContinuum # 200kV Cryo-TEM(Glacios 2) • Source: Field emission gun (X-FEG) • Accelerating voltage: 80-200kV • Spherical aberration: 2.7mm • Information limit: 0.23 nm (alpha tilt = 0°), 0.34 nm (alpha tilt = ± 70°) • Lenses: 2-condenser lens • Symmetric constant power objective lens • Loading: Automated and contamination-free cryo-autoloader (up to 12 Autogrids) • Stages: Computerized specimen stage with ± 70° alpha tilt • Pole piece gap: 11mm • Detector: Ceta-D, Falcon4i # Cryo-FIB(Aquilos 2+) • Electron Gun : Schottly emitter • Electron beam resolution : 2.6nm at 2kV, 1.6nm at 30kV (at room temperature), 6.0 nm at 2kV (at cryo condition) • Electron beam probe current : 1pA to 400nA • Electron beam accelerating voltage : 200 V to 30 kV • Ion beam resolution : 7nm at 30kV at cryo condition • Ion beam probe current : 1.5pA to 65nA (15 position aperture strip) • Ion beam accelerating voltage : 500 V to 30 kV • Cryo stage system : X,Y :110 mm, Z : 65 mm motorized • Terminal temperature at stage <-180℃

300kV TEM, X-FEG 사용하여 고해상도의 구조를 효율적으로 규명, 단일 입자 분석(Single particle analysis), 초저온 전자 단층 촬영(Cryo-electron tomography), 마이크로 전자 회절(micro electron diffraction)