- 모델명: JEM-F200 (JEOL社) - 분석기능 1) 영상분석 (TEM, STEM) 2) 원소성분분석 (dual-EDS) 3) 3D Tomography 4) 4D STEM 5) 비대기분석 지원 (FIB4/CryoFIB와 연계, Mel-build holder 사용)

Features • Quad-Lens condenser system - Easy selection of illumination conditions • Pico stage drive - Fast and precise stage combining new actuator and piezo drive • Improved cold FEG - High brightness with small energy spread • Dual SDD EDS - High efficient analysis • Advance scan system - High stabilized multifunction STEM Additional Options • Energy Dispersive X-Ray Spectrometer (EDS) - Resolution : 133 or less - Detector : Silicon drift detector (SDD) - Detection Range : Be to U • Direct camera (Metro) Specification • Resolution - TEM : 0.23nm (point), 0.1nm (lattice) - STEM : 0.16nm (DF) • Magnification - TEM: ×50 – 2,000,000 - STEM: ×200 – 150,000,000 • Electron gun - Cold field emission gun - Accelerating voltage: 80, 200 kV

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