LT-MFM/AFM/STM/SHPM SYSTEM / 저온측정장비
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- 도입년도
- 2009
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- 모델명
- LT-MFM/AFM/SHPM system
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- 취득금액
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- 제조국가 / 제조사
- 영국 / Nano Magnetics Instrument
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- 수량
- 1
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- 운영기관
- 약학/의과대학행정실
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- 설치장소
- 21116c
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- 담당자 연락처 / e-mail
- / gk10004
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장비설명
닫기we use a micro/nano-fabricated Hall sensor to measure the local magnetic flux density across the sample surface. The sensor is brought into close proximity of the sample surface using STM or AFM positioning techniques. We achieved 50nm lateral resolution at 300K. Quantitative & Non-invasive magnetic measurements with Scanning Hall Probe Microscopy with up to 50 nm spatial resolution Multi-Mode: AFM MFM STM EFM options. Real time scanning with SHPM Image Local magnetic fields with unprecedented sensitivity: 60nT/√Hz@77K 6nT/√Hz@4.2K Fits into almost any cryostat: 23.6 mm or 25.4 mm OD Realtime scans (~1 frame/second) to investigate dynamic magnetic phenomena Large scan area at 4.2 K : 16?m x 16?m Optional 6?m x 6?m and 1.5 ?m x 1.5 ?m scan areas. 3mm range X-Y Positioners 저온에서 나노 이미지 형성 및 나노 입자의 전자전송 특성을 측정하기 위한 장비임
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