The JEOL JEM-ARM200F (Atomic Resolution Microscope) is a high-performance TEM with a field emission cathode for analysis at the atomic level in materials science, nanotechnology and lifescinece. This instrument includes completely newly designed, highly stable electron optics with integrated correction of the spherical aberrations (Cs) of the objective and/or condenser lens.

.Atomic Resolution Analytical Microscope(JEM-ARM200F(UHR) Double Cs with CFFE) : 1set -Electron Microscope Basic Unit -Double Corrector HT Cable -Ultra High Resolution Polepiece -Lens Data -Beam Stopper -STEM/TEM Cs Corrector Assembly Parts (각1) -UHR TEM Cs Corrector -Obj. Lens -Computer Unit / -Main Monitor * Acc. -TEM CCD Camera(1095, One View 16 Megapixel Camera), PC Sys. 외 -GIF Sys.(Model 965 GIF Quantum ER, P-Scintillator) 외 -UPS for FE-TEM(20KVA)&CWC(10KVA) -Cooling Water Circulator -Air Compressor

낮은 가속전압에서 2-D materials sample의 Atomic Structure분석 가능. 원자단위의 성분 분석 및 mapping으로 정량/정성분석 가능. Sample의 종류에 따른 EELS spectrum 분석.

재료의 미세구조 분석(결정구조분석 및 화학조성분석)